Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10929970 | Component mounting system and trace data acquisition method | Mitsuo Nakamura, Syoichi Nishi | 2021-02-23 |
| 10153182 | Substrate processing apparatus | Satoru Hiraki, Hiromi Kiyose, Hideaki Sato, Hiroshi Komiya | 2018-12-11 |
| 8712572 | Electronic component mounting machine and operating instruction method for the same | Masahiro Kihara, Kazuo Okamoto, Hidehiko Watanabe, Kenichi Kaida, Hideki Sumi +1 more | 2014-04-29 |
| 8646174 | Device and method for mounting electronic components | Kenichi Kaida, Hideki Sumi, Masahiro Kihara, Kenichirou Ishimoto | 2014-02-11 |
| 8453526 | Method of inspecting mount state of component | Kenichi Kaida | 2013-06-04 |
| 8390816 | Method for attenuated total reflection far ultraviolet spectroscopy and an apparatus for measuring concentrations therewith | Naomi Kariyama, Akifumi Ikehata | 2013-03-05 |
| 7978331 | Attenuated total reflection optical probe and apparatus therewith for spectroscopic measurement of aqueous solution | Yukihiro Ozaki, Akifumi Ikehata | 2011-07-12 |
| 7791729 | Attenuated total reflection probe and spectrometer therewith | Yukihiro Ozaki, Akifumi Ikehata | 2010-09-07 |
| 6943951 | Optical component and dispersion compensation method | Kazuro Kikuchi, Yuichi Takushima, Mark Jablonski, Yuichi Tanaka, Haruki Kataoka +4 more | 2005-09-13 |
| 6765667 | Method for inspection of circuit boards and apparatus for inspection of circuit boards | Daisuke Nagai, Kenichi Kaida | 2004-07-20 |
| 5991031 | Optical density measuring apparatus | — | 1999-11-23 |
| 5748193 | Flat pattern image generation of internal structure data | Koichi Sano | 1998-05-05 |
| 5427100 | Method for determining median line | Koichi Sano, Tetsuo Yokoyama | 1995-06-27 |