Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11906281 | Device and method for measuring thickness and refractive index of multilayer thin film by using angle-resolved spectral reflectometry | Hyug-gyo Rhee | 2024-02-20 |
| 11486700 | System and method for 3D shape measurement of freeform surface based on high-speed deflectometry using composite patterns | The Manh NGUYEN, Hyug-gyo Rhee | 2022-11-01 |
| 11466978 | Apparatus and method for measuring the thickness and refractive index of multilayer thin films using angle-resolved spectral interference image according to polarization | Hyug-gyo Rhee | 2022-10-11 |
| 11255662 | System and method for compensating for non-linear response characteristic in phase-shifting deflectometry | The-mahn Nguyen, Hyug-gyo Rhee | 2022-02-22 |
| 11243070 | Apparatus and method for multilayer thin film thickness measurement using single-shot angle-resolved spectral reflectometry | Hyug-gyo Rhee | 2022-02-08 |
| 10466031 | Apparatus for measuring thickness and surface profile of multilayered film structure using imaging spectral optical system and measuring method | Hyug-gyo Rhee, Yun-Woo Lee | 2019-11-05 |
| 9863814 | Correction of rotational inaccuracy in lateral shearing interferometry | Hyug-gyo Rhee, Ho Soon Yang, Yun-Woo Lee | 2018-01-09 |
| 7483147 | Apparatus and method for measuring thickness and profile of transparent thin film using white-light interferometer | Seung-Woo Kim | 2009-01-27 |