Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852581 | Method for calibrating nano measurement scale and standard material used therein | Kyung-joong Kim, Gyea Young Kwak, Hyungung Yu, Seung Mi Lee | 2023-12-26 |
| 11630527 | Input device and electronic device interacting with input device | Minjun KIM, Duckwon Yoon, Moonkyou Kim, Byungku Park, Minchul Sung +2 more | 2023-04-18 |