Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852581 | Method for calibrating nano measurement scale and standard material used therein | Kyung-joong Kim, Taegun Kim, Hyungung Yu, Seung Mi Lee | 2023-12-26 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11852581 | Method for calibrating nano measurement scale and standard material used therein | Kyung-joong Kim, Taegun Kim, Hyungung Yu, Seung Mi Lee | 2023-12-26 |