Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9921051 | Thickness measuring apparatus and thickness measuring method | Jae Wan Kim, Jong-Ahn Kim, Chu-Shik Kang | 2018-03-20 |
| 9651403 | Absolute position measurement method, absolute position measurement apparatus and scale | Jong-Ahn Kim, Jae Wan Kim, Tae-Bong Eom, Chu-Shik Kang | 2017-05-16 |
| 9121696 | Device and method for measuring via hole of silicon wafer | Jae Wan Kim, Jong-Ahn Kim, Chu-Shik Kang | 2015-09-01 |
| 8009350 | Laptop-size high-order harmonic generation apparatus using near field enhancement | Seung-Woo Kim, Seung Chul KIM, In Yong Park | 2011-08-30 |