Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9921051 | Thickness measuring apparatus and thickness measuring method | Jae Wan Kim, Jong-Ahn Kim, Jong-Han Jin | 2018-03-20 |
| 9651403 | Absolute position measurement method, absolute position measurement apparatus and scale | Jong-Ahn Kim, Jae Wan Kim, Tae-Bong Eom, Jong-Han Jin | 2017-05-16 |
| 9121696 | Device and method for measuring via hole of silicon wafer | Jong-Han Jin, Jae Wan Kim, Jong-Ahn Kim | 2015-09-01 |
| 8290007 | Apparatus and method for stabilizing frequency of laser | Jae Wan Kim, Tae-Bong Eom, Jong-Ahn Kim | 2012-10-16 |
| 8279448 | Shape measurement apparatus and method | Jae Wan Kim, Tae-Bong Eom, Jong-Ahn Kim | 2012-10-02 |