HL

Hye In Lee

KI Korea Electronics Technology Institute: 8 patents #48 of 614Top 8%
KT Koh Young Technology: 4 patents #31 of 142Top 25%
SY Synopsys: 1 patents #1,143 of 2,302Top 50%
📍 Anyang-si, CA: #27 of 45 inventorsTop 60%
Overall (All Time): #359,355 of 4,157,543Top 9%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
12400412 Method for modifying design on basis of additive cross-section outline for 3D printing Hwa Seon Shin, Sung Hwan Chun, Sung Hun Park 2025-08-26
12350886 3D printing slicing method for solving quantization error problem Hwa Seon Shin, Sung Hwan Chun, Sung Hun Park, Ji Min Jang 2025-07-08
12233601 Method for creating 2D slicing polyline based support structure for 3D printing Hwa Seon Shin, Sung Hwan Chun, Sung Hun Park 2025-02-25
12220921 Nozzle clogging defect compensating method for binder jetting stack manufacturing means Hwa Seon Shin, Sung Hun Park, Sung Hwan Chun, Jin Min Jang 2025-02-11
12202206 3D printing slicing method for solving tolerance problem Hwa Seon Shin, Sung Hwan Chun, Sung Hun Park 2025-01-21
11836425 Engineering change orders with consideration of adversely affected constraints Seungwhun Paik 2023-12-05
11798231 Method for generating hollow structure based on 2D laminated cross-sectional outline for 3D printing Hwa Seon Shin, Sung Hwan Chun, Sung Hun Park, Ji Min Jang 2023-10-24
11613082 Method for producing 3D mesh surface characteristic-based support for laminate manufacturing Hwa Seon Shin, Sung Hwan Chun, Ji Min Jang, Sung Hun Park 2023-03-28
11548227 Method for monitoring 3D printing equipped with 3D printing slicer and recursive loop structure Hwa Seon Shin, Sung Hwan Chun 2023-01-10
10796428 Inspection system and inspection method Seung Ae Seo, Won Mi AHN, Jong Hui LEE 2020-10-06
10672116 Substrate inspection method and system Seung Ae Seo, Yeon Hee Lee, Won Mi AHN, Jong Hui LEE 2020-06-02
10650510 Substrate inspection apparatus and method Seung Ae Seo, Yeon Hee Lee, Won Mi AHN, Jong Hui LEE 2020-05-12
10430940 Inspection system and inspection method Seung Ae Seo, Won Mi AHN, Jong Hui LEE 2019-10-01