TT

Tomikazu Tanuki

KO Komatsu: 12 patents #107 of 2,087Top 6%
ST Sumco Techxiv: 1 patents #56 of 144Top 40%
Overall (All Time): #378,704 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
10800406 Mining machine, management system of mining machine, and management method of mining machine Katsuki Awamori 2020-10-13
10321097 Perimeter monitoring device for work vehicle Shinji Mitsuta, Shigeru Harada, Eishin Masutani, Yukihiro Nakanishi, Takeshi Kurihara +2 more 2019-06-11
9956915 Dump truck periphery monitoring apparatus Shinji Mitsuta, Shigeru Harada, Eishin Masutani, Yukihiro Nakanishi, Takeshi Kurihara +2 more 2018-05-01
9597997 Work vehicle periphery monitoring apparatus Shinji Mitsuta, Shigeru Harada, Eishin Masutani, Yukihiro Nakanishi, Takeshi Kurihara +2 more 2017-03-21
9497422 Perimeter monitoring device for work vehicle Shinji Mitsuta, Shigeru Harada, Eishin Masutani, Yukihiro Nakanishi, Takeshi Kurihara +2 more 2016-11-15
9457719 Work vehicle periphery monitoring system and work vehicle Dai Tsubone, Takeshi Kurihara 2016-10-04
9442194 Dump truck with obstacle detection mechanism and method for detecting obstacle Takeshi Kurihara, Masaomi Machida, Dai Tsubone, Yukihiro Nakanishi, Shinji Mitsuta +2 more 2016-09-13
9294736 Working vehicle periphery monitoring system and working vehicle Takeshi Kurihara 2016-03-22
9291709 Dump truck Shinji Mitsuta, Shigeru Harada, Eishin Masutani, Yukihiro Nakanishi, Takeshi Kurihara +2 more 2016-03-22
9204106 Load display device for dump truck Shinji Mitsuta, Shigeru Harada, Eishin Masutani, Yukihiro Nakanishi, Takeshi Kurihara +2 more 2015-12-01
8982212 Surrounding area monitoring device for work vehicle Shinji Mitsuta, Shigeru Harada, Eishin Masutani, Yukihiro Nakanishi, Takeshi Kurihara +2 more 2015-03-17
7383156 Apparatus for inspecting wafer surface, method for inspecting wafer surface, apparatus for judging defective wafer, method for judging defective wafer, and apparatus for processing information on wafer surface Kouzou Matsusita, Yukinori Matsumura, Mitsuo Terada, Kotaro Hori, Kiyoharu Miyakawa +2 more 2008-06-03
6005965 Inspection apparatus for semiconductor packages Yukihiro Tsuda, Takashi Kurihara, Takahiro Ueda, Yasuyoshi Suzuki 1999-12-21