Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8045150 | Semiconductor wafer inspection method | Kantarou Torii | 2011-10-25 |
| 6234873 | Semiconductor mirror-polished surface wafers and method for manufacturing the same | Hiroaki Yamamoto, Akihiro Ishii | 2001-05-22 |
| 5849636 | Method for fabricating a semiconductor wafer | Takamitsu Harada, Hisaya Fukunaga, Masahiko Maeda | 1998-12-15 |