Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387310 | Wafer signature local maxima via clustering for metrology guided inspection | Alan Davila, Marcus Liesching, Sandeep Bhagwat, Surya Vanamali, Suresh Selvaraj +3 more | 2025-08-12 |