Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387310 | Wafer signature local maxima via clustering for metrology guided inspection | Alan Davila, Marcus Liesching, Sandeep Bhagwat, Surya Vanamali, Suresh Selvaraj +3 more | 2025-08-12 |
| 11748868 | Unsupervised pattern synonym detection using image hashing | Narayani Narasimhan | 2023-09-05 |
| 10930597 | Die screening using inline defect information | Alex Teng Song Lim | 2021-02-23 |