Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10014229 | Generating a wafer inspection process using bit failures and virtual inspection | Poh Boon Yong, George Simon | 2018-07-03 |
| 9277186 | Generating a wafer inspection process using bit failures and virtual inspection | Poh Boon Yong, George Simon | 2016-03-01 |