Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10204290 | Defect review sampling and normalization based on defect and design attributes | — | 2019-02-12 |
| 10133263 | Process condition based dynamic defect inspection | — | 2018-11-20 |
| 10014229 | Generating a wafer inspection process using bit failures and virtual inspection | George Simon, Yuezhong Du | 2018-07-03 |
| 9277186 | Generating a wafer inspection process using bit failures and virtual inspection | George Simon, Yuezhong Du | 2016-03-01 |