Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11748871 | Alignment of a specimen for inspection and other processes | Xuguang Jiang, Tong Huang, N R Girish, Yiyu Zhang, Faisal Omer +2 more | 2023-09-05 |
| 10957033 | Repeater defect detection | Premchandra M. Shankar, JuHwan Rha | 2021-03-23 |
| 10062156 | Method and system for detecting defects on a substrate | Premchandra M. Shankar | 2018-08-28 |