Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4579455 | Photomask inspection apparatus and method with improved defect detection | Kenneth L. Levy, Steve Buchholz, Mark J. Wihl | 1986-04-01 |
| 4555798 | Automatic system and method for inspecting hole quality | Steve Buchholz, Peter Eldredge, Mark J. Wihl | 1985-11-26 |