Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7739065 | Inspection plan optimization based on layout attributes and process variance | Sherry Lee, Kenneth R. Harris | 2010-06-15 |
| 4926489 | Reticle inspection system | Donald L. Danielson, Mark J. Wihl | 1990-05-15 |
| 4448532 | Automatic photomask inspection method and system | Peter Eldredge | 1984-05-15 |