Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11740287 | Semiconductor device and semiconductor device examination method | Isao Ooigawa, Nariyuki Fukuda, Kazuhito HOSAKA, Takeshi Yamaguchi, Suguru Tahara +3 more | 2023-08-29 |
| 10311965 | Semiconductor circuit | Nariyuki Fukuda, Kazuhito HOSAKA, Takeshi Yamaguchi, Suguru Tahara, Isao Ooigawa +2 more | 2019-06-04 |