Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11740287 | Semiconductor device and semiconductor device examination method | Nariyuki Fukuda, Kazuhito HOSAKA, Tsutomu Miyamae, Takeshi Yamaguchi, Suguru Tahara +3 more | 2023-08-29 |
| 10311965 | Semiconductor circuit | Tsutomu Miyamae, Nariyuki Fukuda, Kazuhito HOSAKA, Takeshi Yamaguchi, Suguru Tahara +2 more | 2019-06-04 |
| 8598944 | Semiconductor integrated circuit deciding a power-supply voltage based on a delay test | Nariyuki Fukuda, Noriyuki Moriyasu, Toshiyuki Furusawa, Satoko Kawakami, Hitoshi Nemoto +3 more | 2013-12-03 |