Issued Patents All Time
Showing 25 most recent of 61 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12408334 | Method for manufacturing fully self-aligned high-density 3D multi-layer memory | Ke Wang | 2025-09-02 |
| 11990193 | One time programmable (OTP) memory array and read and write method thereof | Junhua Mao | 2024-05-21 |
| 11721585 | Method for fabricating semiconductor memory and the semiconductor memory | — | 2023-08-08 |
| 10510427 | High reliable OTP memory with low reading voltage | Xuyang Liao, Junhua Mao | 2019-12-17 |
| 10504908 | High reliability OTP memory by using of voltage isolation in series | Junhua Mao, Xuyang Liao | 2019-12-10 |
| 8797820 | Soft breakdown mode, low voltage, low power antifuse-based non-volatile memory cell | David Fong | 2014-08-05 |
| 8789267 | Chip packaging fixture using magnetic field for self-alignment | David Fong | 2014-07-29 |
| 8780660 | Spurious induced charge cleanup for one time programmable (OTP) memory | — | 2014-07-15 |
| 8731230 | Loudspeaker structure with inner frame | Yeh-Feng Chou | 2014-05-20 |
| 8520877 | Resonant structure for loudspeaker | Yeh-Feng Chou | 2013-08-27 |
| 8490938 | In-ceiling, in-wall one button installer | — | 2013-07-23 |
| 8259518 | Low voltage and low power memory cell based on nano current voltage divider controlled low voltage sense MOSFET | David Fong | 2012-09-04 |
| 7907465 | Electrically programmable fuse bit | David Fong, Glen Arnold Rosendale | 2011-03-15 |
| 7609539 | Electrically programmable fuse bit | David Fong, Glen Arnold Rosendale | 2009-10-27 |
| 7471541 | Memory transistor gate oxide stress release and improved reliability | David Fong, Jianguo Wang, Harry Luan | 2008-12-30 |
| 7411424 | Programmable logic function generator using non-volatile programmable memory switches | Donghui Li, Jason Chen | 2008-08-12 |
| 7277348 | Memory cell comprising an OTP nonvolatile memory unit and a SRAM unit | David Fong, Harry Luan, Jianguo Wang, Zhongshang Liu | 2007-10-02 |
| 7269047 | Memory transistor gate oxide stress release and improved reliability | David Fong, Jianguo Wang, Harry Luan | 2007-09-11 |
| 7263286 | Fast testing system for optical transceiver and testing method thereof | — | 2007-08-28 |
| 7146020 | Structure for the sound coil of loudspeaker | — | 2006-12-05 |
| 7064973 | Combination field programmable gate array allowing dynamic reprogrammability | Zhongshang Liu, David Fong, Fei Ye | 2006-06-20 |
| 7042772 | Methods and circuits for programming of a semiconductor memory cell and memory array using a breakdown phenomenon in an ultra-thin dielectric | Jianguo Wang, David Fong, Fei Ye, Michael Fliesler | 2006-05-09 |
| 7031209 | Methods and circuits for testing programmability of a semiconductor memory cell and memory array using a breakdown phenomenon in an ultra-thin dielectric | Jianguo Wang, David Fong, Fei Ye, Michael Fliesler | 2006-04-18 |
| 6992925 | High density semiconductor memory cell and memory array using a single transistor and having counter-doped poly and buried diffusion wordline | — | 2006-01-31 |
| 6972986 | Combination field programmable gate array allowing dynamic reprogrammability and non-votatile programmability based upon transistor gate oxide breakdown | Zhongshan Liu, Fei Ye, Michael Fliesler | 2005-12-06 |