Issued Patents All Time
Showing 1–25 of 39 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9075946 | Method for designing semiconductor integrated circuit | — | 2015-07-07 |
| 8886487 | Bridge fault removal apparatus, bridge fault removal method, and computer readable medium comprising computer program code for removing bridge fault | — | 2014-11-11 |
| 8508249 | Semiconductor integrated circuit and method for designing the same | — | 2013-08-13 |
| 8185863 | Delay fault test quality calculation apparatus, delay fault test quality calculation method, and delay fault test pattern generation apparatus | Atsuo Takatori | 2012-05-22 |
| 8082534 | Apparatus and method for calculating fault coverage, and fault detection method | — | 2011-12-20 |
| 8051403 | Delay fault test quality calculation apparatus, delay fault test quality calculation method, and delay fault test pattern generation apparatus | Atsuo Takatori | 2011-11-01 |
| 7966138 | Apparatus for creating test pattern and calculating fault coverage or the like and method for creating test pattern and calculating fault coverage or the like | — | 2011-06-21 |
| 7913143 | Test quality evaluating and improving system for semiconductor integrated circuit and test quality evaluation and improvement method for semiconductor integrated circuit | — | 2011-03-22 |
| 7406645 | Test pattern generating apparatus, method for automatically generating test patterns and computer program product for executing an application for a test pattern generating apparatus | — | 2008-07-29 |
| 7392146 | Fault list and test pattern generating apparatus and method, fault list generating and fault coverage calculating apparatus and method | — | 2008-06-24 |
| 7308660 | Calculation system of fault coverage and calculation method of the same | — | 2007-12-11 |
| 7283918 | Apparatus for analyzing fault of semiconductor integrated circuit, method for the same, and computer readable medium for the same | — | 2007-10-16 |
| 7162674 | Apparatus for selecting test patterns for logic circuit, computer implemented method for selecting test patterns, and computer program product for controlling a computer system so as to select test patterns | — | 2007-01-09 |
| 7139956 | Semiconductor integrated circuit device and test method thereof | — | 2006-11-21 |
| 7096140 | Test system, test method and test program for an integrated circuit by IDDQ testing | Mahito Shidou | 2006-08-22 |
| 7093216 | Apparatus connectable to a computer network for circuit design verification, computer implemented method for circuit design verification, and computer program product for controlling a computer system so as to verify circuit designs | — | 2006-08-15 |
| 7082559 | Semiconductor integrated circuit device and test method thereof | — | 2006-07-25 |
| 6834368 | Semiconductor integrated circuit including a test facilitation circuit for functional blocks intellectual properties and automatic insertion method of the same test facilitation circuit | — | 2004-12-21 |
| 6766473 | Test pattern selection apparatus for selecting test pattern from a plurality of check patterns | — | 2004-07-20 |
| 6567946 | Evaluation device of weighted fault coverage and evaluation method of the same | — | 2003-05-20 |
| 6223312 | Test-facilitating circuit for information processing devices | — | 2001-04-24 |
| 6151694 | Method of evaluating fault coverage | — | 2000-11-21 |
| 6148434 | Apparatus and method for minimizing the delay times in a semiconductor device | — | 2000-11-14 |
| 6101623 | Current reduction circuit for testing purpose | — | 2000-08-08 |
| 5867409 | Linear feedback shift register | — | 1999-02-02 |