Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7096140 | Test system, test method and test program for an integrated circuit by IDDQ testing | Yasuyuki Nozuyama | 2006-08-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7096140 | Test system, test method and test program for an integrated circuit by IDDQ testing | Yasuyuki Nozuyama | 2006-08-22 |