Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6445002 | SRAM-based semiconductor integrated circuit testing element | Yutaka Tanaka, Tetsuya Asami, Youichi Satou, Noriaki Okumiya | 2002-09-03 |
| 6223097 | Semiconductor integrated circuit device, method of estimating failure ratio of such devices on the market, and method of manufacturing the devices | Yutaka Tanaka, Tetsuya Asami, Youichi Satou, Noriaki Okumiya | 2001-04-24 |
| 5726522 | Device for generating high voltage | — | 1998-03-10 |