Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6445002 | SRAM-based semiconductor integrated circuit testing element | Takehiro Hashimoto, Yutaka Tanaka, Tetsuya Asami, Youichi Satou | 2002-09-03 |
| 6223097 | Semiconductor integrated circuit device, method of estimating failure ratio of such devices on the market, and method of manufacturing the devices | Takehiro Hashimoto, Yutaka Tanaka, Tetsuya Asami, Youichi Satou | 2001-04-24 |