Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11125775 | Probe and manufacturing method of probe for scanning probe microscope | See Kei Lee, Masumi Saitoh | 2021-09-21 |
| 11069513 | Charged particle beam apparatus | See Kei Lee | 2021-07-20 |
| 8716681 | Sample processing method | Hitomi Kawaguchiya | 2014-05-06 |
| 5770512 | Semiconductor device | Atsushi Murakoshi, Masao Iwase, Kyoichi Suguro, Tadayuki Asaishi | 1998-06-23 |
| 5767521 | Electron-beam lithography system and method for drawing nanometer-order pattern | Shiro Takeno, Shigeru Kanbayashi, Seizo Doi, Iwao Higashikawa | 1998-06-16 |
| 5656859 | Semiconductor device | Atsushi Murakoshi, Masao Iwase, Kyoichi Suguro, Tadayuki Asaishi | 1997-08-12 |