Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11060990 | Semiconductor measurement device and method of measuring semiconductor | Jun Hirota, Tsukasa Nakai, Kazunori Harada | 2021-07-13 |
| 9475213 | Method for reproducing template and reproducing apparatus | Hideaki Hirabayashi | 2016-10-25 |