MO

Masaki Ogihara

KT Kabushiki Kaisha Toshiba: 28 patents #933 of 21,451Top 5%
HI Hitachi: 3 patents #10,712 of 28,497Top 40%
Overall (All Time): #119,863 of 4,157,543Top 3%
31
Patents All Time

Issued Patents All Time

Showing 1–25 of 31 patents

Patent #TitleCo-InventorsDate
7190254 Emigrant reception system, emigrant gate system, emigrant control system, emigrant control method, passport applicant information management method, layout of emigrant gate, immigrant reception system, immigrant gate system, immigrant control system, immigrant control method, layout of immigrant gate system, and passport Ryo Imura, Yasuhiko Mizuno 2007-03-13
7182257 Distribution management method and system Yasuhiko Mizuno, Rei Itsuki 2007-02-27
6880753 Distribution management method and system Yasuhiko Mizuno, Rei Itsuki 2005-04-19
RE37427 Dynamic type memory Satoru Takase, Kiyofumi Sakurai 2001-10-30
6141288 Semiconductor memory device allowing change of refresh mode and address switching method therewith Kenji Numata 2000-10-31
5970015 Semiconductor integrated circuit device allowing change of product specification and chip screening method therewith Kenji Numata 1999-10-19
5812481 Semiconductor integrated circuit device allowing change of product specification and chip screening method therewith Kenji Numata 1998-09-22
5726475 Semiconductor device having different impurity concentration wells Shizuo Sawada, Syuso Fujii 1998-03-10
5712827 Dynamic type memory Satoru Takase, Kiyofumi Sakurai 1998-01-27
5642326 Dynamic memory Kiyofumi Sakurai, Satoru Takase 1997-06-24
5633827 Semiconductor integrated circuit device allowing change of product specification and chip screening method therewith Kenji Numata 1997-05-27
5619162 Dram using word line potential circuit control 1997-04-08
5586078 Dynamic type memory Satoru Takase, Kiyofumi Sakurai 1996-12-17
5559748 Semiconductor integrated circuit allowing change of product specification and chip screening method therewith Kenji Numata 1996-09-24
5550504 Dram using word line potential control circuit 1996-08-27
5475646 Screening circuitry for a dynamic random access memory 1995-12-12
5420816 Semiconductor memory apparatus with configured word lines to reduce noise Syuso Fujii 1995-05-30
5386386 Redundancy circuit having a spare memory block replacing defective memory cells in different blocks 1995-01-31
5374838 Semiconductor device having different impurity concentration wells Shizuo Sawada, Syuso Fujii 1994-12-20
5371710 Semiconductor memory device having test mode 1994-12-06
5335205 DRAM using word line potential control circuitcircuit 1994-08-02
5303193 Semiconductor device 1994-04-12
5272672 Semiconductor memory device having redundant circuit 1993-12-21
5260226 Semiconductor device having different impurity concentration wells Shizuo Sawada, Syuso Fujii 1993-11-09
5238860 Semiconductor device having different impurity concentration wells Shizuo Sawada, Syuso Fujii 1993-08-24