Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10853538 | Model generation system and model generation method | Yukihito Nishida | 2020-12-01 |
| 10387532 | Manufacturing control system, manufacturing control method, and manufacturing control program | — | 2019-08-20 |
| 10001774 | Manufacturing supporting system, manufacturing supporting method, and manufacturing supporting program for electronic device | Muneyoshi Yamada | 2018-06-19 |
| 9760085 | Production support system, production support method, and production support program | Muneyoshi Yamada, Atsushi Itoh, Yuuji Fujita | 2017-09-12 |
| 8019456 | Product repair support system, product manufacturing system, and product manufacturing method | — | 2011-09-13 |
| 6780657 | Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafers | Tomomi Ino, Yoshiaki Akama | 2004-08-24 |
| 6541287 | Temperature measuring method and apparatus, measuring method for the thickness of the formed film, measuring apparatus for the thickness of the formed film thermometer for wafers | Tomomi Ino, Yoshiaki Akama | 2003-04-01 |