Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12372461 | Imaging device, inspection device, and imaging method | Tohru Watanabe, Hideki Ota | 2025-07-29 |
| 12307652 | Print inspection device, print inspection method, and program | Shenglan Li, Kazumi Banno, Masaki Nagase, Hideki Ota | 2025-05-20 |
| 11983863 | Inspection system using machine learning to label image segments of defects | Kazumi Banno, Yuichi Yamagishi, Hiroyuki Kibe | 2024-05-14 |
| 9823262 | Container inspection device | Osamu Yoshida, Chizuka Kai | 2017-11-21 |
| 8831313 | Method for detecting microorganisms, device for detecting microorganisms and program | Shenglan Li, Takashi Nishida, Chizuka Kai | 2014-09-09 |
| 8831326 | Method for counting colonies | Takashi Nishida, Shenglan Li, Chizuka Kai | 2014-09-09 |