Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12307652 | Print inspection device, print inspection method, and program | Shenglan Li, Masaki Nagase, Hideki Ota, Kunimitsu Toyoshima | 2025-05-20 |
| 11983863 | Inspection system using machine learning to label image segments of defects | Yuichi Yamagishi, Hiroyuki Kibe, Kunimitsu Toyoshima | 2024-05-14 |