Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12334300 | Focused ion beam system and method of correcting deviation of field of view of ion beam | Keiji Tajima | 2025-06-17 |
| 10361062 | Scanning electron microscope | Tatsuru Kuramoto, Yoshinori Matsuda, Makoto Aoshima | 2019-07-23 |
| 10269531 | Scanning electron microscope | Tatsuru Kuramoto, Yoshinori Matsuda, Makoto Aoshima | 2019-04-23 |