Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10361062 | Scanning electron microscope | Yuichiro Ohori, Yoshinori Matsuda, Makoto Aoshima | 2019-07-23 |
| 10269531 | Scanning electron microscope | Yuichiro Ohori, Yoshinori Matsuda, Makoto Aoshima | 2019-04-23 |
| 9396905 | Image evaluation method and charged particle beam device | — | 2016-07-19 |
| 8957372 | Scanning electron microscope | — | 2015-02-17 |
| 8466416 | Electron detecting mechanism and charged particle beam system equipped therewith | Makoto Aoshima | 2013-06-18 |