Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6723987 | Method of inspecting holes using charged-particle beam | — | 2004-04-20 |
| 6653629 | Specimen inspection instrument | Yukihiro Tanaka, Sadao Matsumoto, Hirofumi Miyao | 2003-11-25 |