Issued Patents All Time
Showing 51–75 of 88 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7411390 | High resolution inductive sensor arrays for UXO | Darrell E. Schlicker, Ian Shay, Andrew P. Washabaugh | 2008-08-12 |
| 7385392 | Eddy current sensing arrays and system | Darrell E. Schlicker, Eric Lee Miller | 2008-06-10 |
| 7348771 | Method for verifying sensor condition | Darrell E. Schlicker, Karen E. Walrath, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukemik | 2008-03-25 |
| 7289913 | Local feature characterization using quasistatic electromagnetic sensors | Darrell E. Schlicker, Andrew P. Washabaugh, Yanko K. Sheiretov, Mark Windoloski | 2007-10-30 |
| 7280940 | Segmented field dielectric sensor array for material characterization | Darrell E. Schlicker, Yanko K. Sheiretov, Andrew P. Washabaugh, David C. Grundy, Vladimir A. Zilberstein | 2007-10-09 |
| 7230421 | Damage standard fabrication with attached sensor | Darrell E. Schlicker, Karen E. Walrath, Volker Weiss, Andrew P. Washabaugh, Vladimir A. Zilberstein | 2007-06-12 |
| 7188532 | Self-monitoring metals, alloys and materials | Vladimir A. Zilberstein, David C. Grundy, Andrew P. Washabaugh, Darrell E. Schlicker, Ian Shay +5 more | 2007-03-13 |
| 7183764 | Method for inspecting a channel using a flexible sensor | Darrell E. Schlicker, Vladimir Tsukernik, Ian Shay, David C. Grundy, Andrew P. Washabaugh | 2007-02-27 |
| 7161351 | Hidden feature characterization using a database of sensor responses | Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay, Robert Joseph Lyons +1 more | 2007-01-09 |
| 7161350 | Method for material property monitoring with perforated, surface mounted sensors | Darrell E. Schlicker, David C. Clark, Karen E. Walrath, Volker Weiss, William M. Chepolis +3 more | 2007-01-09 |
| 7106055 | Fabrication of samples having predetermined material conditions | Vladimir A. Zilberstein, David C. Grundy, Volker Weiss, Andrew P. Washabaugh | 2006-09-12 |
| 7095224 | Process control and damage monitoring | Darrell E. Schlicker, Andrew P. Washabaugh, David C. Grundy, Vladimir A. Zilberstein | 2006-08-22 |
| RE39206 | Absolute property measurement with air calibration | Darrell E. Schlicker, Andrew P. Washabaugh | 2006-07-25 |
| 7049811 | Test circuit having parallel drive segments and a plurality of sense elements | Darrell E. Schlicker, Andrew P. Washabaugh, Karen E. Walrath, Ian Shay, David C. Grundy +1 more | 2006-05-23 |
| 6995557 | High resolution inductive sensor arrays for material and defect characterization of welds | Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay, Andrew P. Washabaugh | 2006-02-07 |
| 6992482 | Magnetic field sensor having a switchable drive current spatial distribution | Ian Shay, Andrew P. Washabaugh, Darrell E. Schlicker | 2006-01-31 |
| 6952095 | Surface mounted and scanning spatially periodic eddy-current sensor arrays | Darrell E. Schlicker, Andrew P. Washabaugh, Vladimir A. Zilberstein, Vladimir Tsukernik | 2005-10-04 |
| 6798198 | Fluid supports for sensors | Vladimir Tsukernik, Andrew P. Washabaugh, Darrell E. Schlicker, Karen E. Walrath, Eric D. Hill +1 more | 2004-09-28 |
| 6784662 | Eddy current sensor arrays having drive windings with extended portions | Darrell E. Schlicker, Andrew P. Washabaugh, Karen E. Walrath, Ian Shay, David C. Grundy +1 more | 2004-08-31 |
| 6781387 | Inspection method using penetrant and dielectrometer | Darrell E. Schlicker, Markus Zahn, Wayne D. Ryan, Ian Shay, Andrew P. Washabaugh | 2004-08-24 |
| 6727691 | High resolution inductive sensor arrays for material and defect characterization of welds | Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay, Andrew P. Washabaugh | 2004-04-27 |
| 6657429 | Material condition assessment with spatially periodic field sensors | Darrell E. Schlicker, Andrew P. Washabaugh, Vladimir A. Zilberstein | 2003-12-02 |
| 6486673 | Segmented field dielectrometer | Darrell E. Schlicker, Markus Zahn, Wayne D. Ryan, Yanko K. Sheiretov, Andrew P. Washabaugh | 2002-11-26 |
| 6433542 | Apparatus and method for obtaining increased sensitivity, selectivity and dynamic range in property measurement using magnetometers | James R. Melcher | 2002-08-13 |
| 6420867 | Method of detecting widespread fatigue and cracks in a metal structure | David C. Clark, Karen E. Walrath, Volker Weiss, William M. Chepolis | 2002-07-16 |