AW

Andrew P. Washabaugh

JS Jentek Sensors: 50 patents #2 of 43Top 5%
📍 Chula Vista, CA: #3 of 742 inventorsTop 1%
🗺 California: #7,932 of 386,348 inventorsTop 3%
Overall (All Time): #53,865 of 4,157,543Top 2%
50
Patents All Time

Issued Patents All Time

Showing 26–50 of 50 patents

Patent #TitleCo-InventorsDate
7451639 Engine blade dovetail inspection Neil J. Goldfine, Mark Windoloski, Vladimir Tsukernik, Darrell E. Schlicker, Todd M Dunford 2008-11-18
7411390 High resolution inductive sensor arrays for UXO Neil J. Goldfine, Darrell E. Schlicker, Ian Shay 2008-08-12
7348771 Method for verifying sensor condition Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Vladimir A. Zilberstein, Vladimir Tsukemik 2008-03-25
7289913 Local feature characterization using quasistatic electromagnetic sensors Darrell E. Schlicker, Neil J. Goldfine, Yanko K. Sheiretov, Mark Windoloski 2007-10-30
7280940 Segmented field dielectric sensor array for material characterization Neil J. Goldfine, Darrell E. Schlicker, Yanko K. Sheiretov, David C. Grundy, Vladimir A. Zilberstein 2007-10-09
7230421 Damage standard fabrication with attached sensor Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Volker Weiss, Vladimir A. Zilberstein 2007-06-12
7188532 Self-monitoring metals, alloys and materials Neil J. Goldfine, Vladimir A. Zilberstein, David C. Grundy, Darrell E. Schlicker, Ian Shay +5 more 2007-03-13
7183764 Method for inspecting a channel using a flexible sensor Neil J. Goldfine, Darrell E. Schlicker, Vladimir Tsukernik, Ian Shay, David C. Grundy 2007-02-27
7161351 Hidden feature characterization using a database of sensor responses Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay +1 more 2007-01-09
7161350 Method for material property monitoring with perforated, surface mounted sensors Neil J. Goldfine, Darrell E. Schlicker, David C. Clark, Karen E. Walrath, Volker Weiss +3 more 2007-01-09
7106055 Fabrication of samples having predetermined material conditions Neil J. Goldfine, Vladimir A. Zilberstein, David C. Grundy, Volker Weiss 2006-09-12
7095224 Process control and damage monitoring Neil J. Goldfine, Darrell E. Schlicker, David C. Grundy, Vladimir A. Zilberstein 2006-08-22
RE39206 Absolute property measurement with air calibration Neil J. Goldfine, Darrell E. Schlicker 2006-07-25
7049811 Test circuit having parallel drive segments and a plurality of sense elements Darrell E. Schlicker, Neil J. Goldfine, Karen E. Walrath, Ian Shay, David C. Grundy +1 more 2006-05-23
6995557 High resolution inductive sensor arrays for material and defect characterization of welds Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay 2006-02-07
6992482 Magnetic field sensor having a switchable drive current spatial distribution Ian Shay, Neil J. Goldfine, Darrell E. Schlicker 2006-01-31
6952095 Surface mounted and scanning spatially periodic eddy-current sensor arrays Neil J. Goldfine, Darrell E. Schlicker, Vladimir A. Zilberstein, Vladimir Tsukernik 2005-10-04
6798198 Fluid supports for sensors Vladimir Tsukernik, Neil J. Goldfine, Darrell E. Schlicker, Karen E. Walrath, Eric D. Hill +1 more 2004-09-28
6784662 Eddy current sensor arrays having drive windings with extended portions Darrell E. Schlicker, Neil J. Goldfine, Karen E. Walrath, Ian Shay, David C. Grundy +1 more 2004-08-31
6781387 Inspection method using penetrant and dielectrometer Neil J. Goldfine, Darrell E. Schlicker, Markus Zahn, Wayne D. Ryan, Ian Shay 2004-08-24
6727691 High resolution inductive sensor arrays for material and defect characterization of welds Neil J. Goldfine, Vladimir A. Zilberstein, Darrell E. Schlicker, David C. Grundy, Ian Shay 2004-04-27
6657429 Material condition assessment with spatially periodic field sensors Neil J. Goldfine, Darrell E. Schlicker, Vladimir A. Zilberstein 2003-12-02
6486673 Segmented field dielectrometer Neil J. Goldfine, Darrell E. Schlicker, Markus Zahn, Wayne D. Ryan, Yanko K. Sheiretov 2002-11-26
6380747 Methods for processing, optimization, calibration and display of measured dielectrometry signals using property estimation grids Neil J. Goldfine, Markus Zahn, Alexander V. Mamishev, Darrell E. Schlicker 2002-04-30
6188218 Absolute property measurement with air calibration Neil J. Goldfine, Darrell E. Schlicker 2001-02-13