DK

Dietmar Kollhof

JG Jenoptik Technologie Gmbh: 1 patents #5 of 26Top 20%
Overall (All Time): #3,618,045 of 4,157,543Top 90%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6075880 Method for detection of defects in the inspection of structured surfaces Joachim Wienecke, Karl-Heinz Franke, Michael A. Graef, Heiko-Ulrich Klaus Kempe 2000-06-13