Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7557933 | Measuring probe, sample surface measuring apparatus and sample surface measuring method | Kenji Fukuzawa, Satoshi Terada | 2009-07-07 |
| 6370306 | Optical waveguide probe and its manufacturing method | Kazuo Sato, Kenji Kato, Masataka Shinogi, Kunio Nakajima, Norio Chiba +4 more | 2002-04-09 |