KF

Kenji Fukuzawa

JA Japan Science And Technology Agency: 1 patents #756 of 2,171Top 35%
Overall (All Time): #3,329,818 of 4,157,543Top 85%
1
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7557933 Measuring probe, sample surface measuring apparatus and sample surface measuring method Mitsuhiro Shikita, Satoshi Terada 2009-07-07