Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12055378 | Thickness measuring device | Hak-Sung Kim, Dong Woon PARK, Heon Su Kim | 2024-08-06 |
| 11781981 | Specimen inspection apparatus and specimen inspection method | Hak-Sung Kim, Dong Woon PARK | 2023-10-10 |
| 11486822 | Specimen inspection device and specimen inspection method | Hak-Sung Kim, Dong Woon PARK | 2022-11-01 |
| 11346659 | Device for measuring thickness of specimen and method for measuring thickness of specimen | Hak-Sung Kim, Dong Woon PARK | 2022-05-31 |
| 11150080 | Thickness measurement apparatus, thickness measurement method, and thickness measurement program | Hak-Sung Kim, Deok Joong Kim, Dong Woon PARK | 2021-10-19 |