Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10354851 | Secondary ion mass spectrometer and secondary ion mass spectrometric method | Rudolf Moellers | 2019-07-16 |
| 8785844 | Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samples | — | 2014-07-22 |
| 6107629 | Method to determine depth profiles in an area of thin coating | Alfred Benninghoven | 2000-08-22 |
| 5633495 | Process for operating a time-of-flight secondary-ion mass spectrometer | — | 1997-05-27 |