Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6107629 | Method to determine depth profiles in an area of thin coating | Ewald Niehuis | 2000-08-22 |
| 4527059 | Laser activated mass spectrometer for the selective analysis of individual trace-like components in gases and liquids | Gunther Kampf, Reimer Holm | 1985-07-02 |
| 4468468 | Process for the selective analysis of individual trace-like components in gases and liquid | Gunther Kampf, Reimer Holm | 1984-08-28 |