Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6275442 | Address decoder and method for ITS accelerated stress testing | J. Michael Hill, Jonathan Lachman | 2001-08-14 |
| 5831990 | Test-mode control for dynamic logic gates | Russell W. Mason | 1998-11-03 |
| 5692026 | Apparatus for reducing capacitive loading of clock and shift signals by shifting register-based devices | Kenneth Koch, II | 1997-11-25 |