Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5534873 | Near field RCS test facility and testing method | Alan R. Weichman, Barton G. Ferrell, Gregory Murden, Phillip D. Alldredge, L. Adam Latham +2 more | 1996-07-09 |
| 4328461 | Apparatus for and method of measuring a high voltage electric field | Joseph E. Lee | 1982-05-04 |