Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5485473 | Method and system for testing an integrated circuit featuring scan design | Peter Rost, Manfred Schmidt, Otto A. Torreiter, Rolf Vogt, Klaus Wagner-Drebenstedt | 1996-01-16 |