Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175654 | Surface inspection system and method for differentiating particulate contamination from defects on a surface of a specimen | Drew Schiltz, Marcin B. Bauza, Acasia Wickett | 2024-12-24 |
| 10598604 | Normal incidence phase-shifted deflectometry sensor, system, and method for inspecting a surface of a specimen | Drew Schiltz | 2020-03-24 |