Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175654 | Surface inspection system and method for differentiating particulate contamination from defects on a surface of a specimen | Marcin B. Bauza, Acasia Wickett, Nathaniel Roisen | 2024-12-24 |
| 11994476 | Multi-color surface inspection system, method for inspecting a surface, and method for calibrating the multi-color surface inspection system | Ming Li | 2024-05-28 |
| 10598604 | Normal incidence phase-shifted deflectometry sensor, system, and method for inspecting a surface of a specimen | Nathaniel Roisen | 2020-03-24 |
| 10261028 | Device for optically inspecting a surface of a sample | Christopher M. Cilip | 2019-04-16 |