Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5648849 | Method of and device for in situ real time quantification of the morphology and thickness of a localized area of a surface layer of a thin layer structure during treatment of the latter | Jean Canteloup | 1997-07-15 |
| 5355217 | Assembly for simultaneous observation and laser interferometric measurements, in particular on thin-film structures | Jean Canteloup | 1994-10-11 |