Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12431328 | Electron microscope and calibration method | — | 2025-09-30 |
| 12253445 | Specimen pretreatment method | Tomohiro Haruta, Yuta Ikeda, Tomohisa Fukuda | 2025-03-18 |
| 11953410 | Specimen support tool, support apparatus and specimen preparation method | Tomohiro Haruta, Tomohisa Fukuda, Yuta Ikeda, Yusuke Toriumi | 2024-04-09 |
| 11679489 | Sample chip worktable and retainer | Tomohisa Fukuda, Yuuta Ikeda, Tomohiro Haruta | 2023-06-20 |
| 11658000 | Sample support and method of fabricating same | Tomohiro Haruta, Yuta Ikeda, Tomohisa Fukuda | 2023-05-23 |
| 11037755 | Observation method, specimen support, and transmission electron microscope | Yuta Ikeda, Tomohiro Haruta, Tomohisa Fukuda | 2021-06-15 |
| 10541111 | Distortion measurement method for electron microscope image, electron microscope, distortion measurement specimen, and method of manufacturing distortion measurement specimen | Kazuya Omoto, Hidetaka Sawada | 2020-01-21 |
| 9613780 | Method of fabricating sample support membrane | — | 2017-04-04 |
| 8829436 | Phase plate and method of fabricating same | Hirofumi Iijima | 2014-09-09 |