Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12131881 | Electron microscope and specimen contamination prevention method | Takeshi Kaneko, Norihiro Okoshi, Sang Tae Park | 2024-10-29 |
| 11676796 | Charged particle beam device | Kazuki Yagi, Bryan W. Reed, Ruth Shewmon Bloom | 2023-06-13 |
| 9997327 | Liner tube and electron microscope | Hidetaka Sawada, Masashi Shimizu | 2018-06-12 |
| 9256068 | Spherical aberration corrector, method of spherical aberration correction, and charged particle beam instrument | Hidetaka Sawada | 2016-02-09 |