Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12051629 | Semiconductor device manufacturing system, semiconductor device inspection device, and semiconductor device manufacturing method | Seunghwa Hyun, Younghwan Kim, Hwayoung Park, Yusang Cheon | 2024-07-30 |
| 11668558 | Thickness estimation method and processing control method | Jongsu Kim, Wansung Park, Doohyun Cho, Sungha Kim, Jaeyoun Wi +4 more | 2023-06-06 |