Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7461314 | Test device | Noriaki Chiba | 2008-12-02 |
| 7187192 | Semiconductor test device having clock recovery circuit | Hideyuki Oshima | 2007-03-06 |
| 6956395 | Tester for testing an electronic device using oscillator and frequency divider | Hideyuki Oshima | 2005-10-18 |
| 6791389 | Variable delay circuit and a testing apparatus for a semiconductor circuit | Hiroyuki Mikami | 2004-09-14 |
| 6768360 | Timing signal generation circuit and semiconductor test device with the same | — | 2004-07-27 |
| 5886536 | Semiconductor tester synchronized with external clock | — | 1999-03-23 |
| 5761100 | Period generator for semiconductor testing apparatus | Masayuki Itoh | 1998-06-02 |